President's background

 

Background of Tadashi Rokkaku, President of Probe Innovation USA

Period Background Achievement
1974/04～2001/07

In Mitsubishi Heavy worked in R&D Center and Machine Tool Business Establishment as Engineer and Project Manager.

・Achieved high precision machine tool by reducing thermal displacement error.

・Developed Inspection machine for LCD, PDP and Print Circuit Board.
2001/08～2002/12

 Worked for OHT Corporation.

Developed PDP Glass Board Inspection Machine and completed commercialization.

Retired OHT with feeling doubtful about the validity of accounting procedure in OHT.
2003/01～2005/12 Worked for Tulip Corporation, probe manufacturer.

Developed Facility of Insulating Coating for probe and completed Electrodeposited Coating Technology.
2006/01～2008/12 Worked for Apex Advanced Technology (AAT), probe card company.

・As the head of Technology Division, using Excel VBA, developed and completed design tool like FEM (Finite Element Method) for canti-lever probe.

・As Director production general manager, completed Technology to apply rare metal, Iridium, to canti-lever probe.

・Achieved stable 4,000k T/D probe life in plant of device manufacturer, Renesas.

・Due to Riemann shock and depression, retired AAT.
2010/08 Founded Probe Innovation, Inc. ・With the help of Sankei Engineering in Yokohama, promoted canti-lever probe and wire probe made of Rhodium.
2015/08 Founded Probe Innovation USA, LLC.

・Became independent from Sankei Engineering and started engineering company to promote vertical probe made of Rhodium.

・Made presentation at SWTW 2015 in the title [ Introduction of "efficient design tools for vertical probe and innovative probe material, Rhodeo6"].

               Presentation PDF Download → pdf.png

・Applied rare metal, Rhodium, to wire probe and cobra probe.
2017/06  

・Made presentation at SWTW 2017 in the title [ Introduction of "efficient design tools for vertical probe and innovative probe material, Rhodeo6" ].

             Presentation PDF Download → pdf.png
2018/12

Based on study of all, vertical probe, wire probe, cobra, spring probe and MEMS and application study of rare metal, suddenly in one day, the idea of "Ultimate Vertical Probe" suddenly descended to us.

Applied patent to Japan, USA and Taiwan

・We reached the Ultimate Solution of Vertical Probe VPT, "Vertical Probe Transformed inside jig".

・We found VPT shows its highest performance when it combined with probe material, Iridium.

( Recently quality of Iridium wire was remarkably improved and thin Iridium wire such as Φ25μ, Φ20μ became available. )